Pulse
Generators For Pulsed I-V, Semiconductor And Component Testing And
Characterization
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The I-V characteristics
of semiconductor devices are functions of frequency and
temperature. Curve tracers and other "DC" test systems
typically step through a range of gate voltages and, at each gate
voltage, sweep the drain voltage over the measurement range. The
device essentially reaches thermal equilibrium and electronic (semiconductor-trap)
equilibrium at each point, yielding different test
characteristics than actual RF operational characteristics.
By pulsing the device
using a pulse generator and taking a measurement during the pulse,
the measurements can be taken before the device heats up. This
circumvents the thermal effects associated with conventional
"DC" testing, more closely approximates the
characteristics of the device when operating at high frequencies,
and doesn't activate the semiconductor "traps".
These pulse generators provide fast rise and fall times, with minimal
overshoot, undershoot and ringing. These controlled voltage
waveforms allow the device under test (DUT) to stabilize at
voltage within a few hundred nanoseconds, allowing I-V
measurements to be made before device heating begins.
DTS-1750A |
| Model |
Max.
Output
Voltage |
Max. Current |
Rise
Time |
Fall Time |
Pulse
Width |
PRF |
Max Duty Cycle |
NOTES |
|
DTS-1750A |
Specifically
designed for accelerated testing of magnetic wire insulation
materials. Specifications vary with options see
data sheet. |
| PVX-2505 |
50V |
10A |
<200ns |
<200ns |
<1µs to 100µs |
0Hz to 50KHz |
50% |
Optimized
for PIV Testing |
| HV1000 |
850V |
17A |
<10ns |
<20ns |
<50ns to 10µs |
0Hz to 1MHz |
1% |
Designed for 50 Ohm Loads |
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PVX-2505 PIV Pulse Generator |
HV1000 |
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